Kurek, J., Szymanowski, K., Chmielewski, L., & Orłowski, A. (2023). Advancing chipboard milling process monitoring through spectrogram-based time series analysis with Convolutional Neural Network using pretrained networks. Machine Graphics and Vision, 32(2), 89–108. https://doi.org/10.22630/MGV.2023.32.2.5