Kurek, Jarosław, Karol Szymanowski, Leszek Chmielewski, and Arkadiusz Orłowski. “Advancing Chipboard Milling Process Monitoring through Spectrogram-Based Time Series Analysis With Convolutional Neural Network Using Pretrained Networks”. Machine Graphics and Vision 32, no. 2 (December 12, 2023): 89–108. Accessed November 21, 2024. https://mgv.sggw.edu.pl/article/view/5760.